Features

The contact angle measuring system SURFTENS HL automatic is designed for use in semiconductor industry and research, in particular for process control of wafer coating and in the photolithographic process.

 

It is characterized by the following features:

- fully automatic contact angle mappings

- space-saving construction

- motorized wafer table x/phi for automatic sample positioning

- motorized, automatic dosing unit

- automatic drop placement

- software controls fully automatic measuring sequence

- comfortable documentation of the measuring results in protocols and in the video images