Optical metrology · Software development · Image processing
Optical metrology · Software development · Image processing
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Measuring systems for drawing dies and punches
Drawing die and wire measurement
Contact angle measuring systems
Micro scriber, Wafer contact angle, wafer stress measurement
Straightness, Flatness, Positioning uncertainty by autocollimator
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Flatness, Bow, Warp, Curvature, Glass thickness
Measuring systems for image intensifier tubes (IIT)
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Products > Drawing die and wire measurement